Journal Article

DKFZ-2019-02720

http://join2-wiki.gsi.de/foswiki/pub/Main/Artwork/join2_logo100x88.png Characterization of monolithic CMOS pixel sensor chip with ion beams for application in particle computed tomography

Tambave, G. ; Alme, J. ; Barnaföldi, G. G. ; Barthel, R. ; van den Brink, A. ; Brons, S. ; Chaar, M. ; Eikeland, V. ; Genov, G. ; Grøttvik, O. ; Pettersen, H. E. S. ; Pastuovic, Z. ; Huiberts, S. ; Helstrup, H. ; Hetland, K. F. ; Mehendale, S. ; Meric, I. ; Malik, Q. W. ; Odland, O. H. ; Papp, G. ; Peitzmann, T. ; Piersimoni, P. ; Ur Rehman, A. ; Reidt, F. ; Richter, M. ; Röhrich, D. ; Sudar, A. ; Samnøy, A. T. ; Seco, J.DKFZ* ; Shafiee, H. ; Skjæveland, E. V. ; Sølie, J. R. ; Ullaland, K. ; Varga-Kofarago, M. ; Volz, L.DKFZ* ; Wagner, B. ; Yang, S.

2020
North-Holland Publ. Co. Amsterdam

Please use a persistent id in citations: doi:10.1016/j.nima.2019.162626

Note: Volume 958, 1 April 2020, 162626

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Contributing Institute(s):

1. E041 Medizinische Physik in der Radioonkologie (E041)

Research Program(s):

1. 315 - Imaging and radiooncology (POF3-315) (POF3-315)

Appears in the scientific report 2020

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Database coverage:
; Clarivate Analytics Master Journal List ; Current Contents - Engineering, Computing and Technology ; Current Contents - Physical, Chemical and Earth Sciences ; Ebsco Academic Search ; IF < 5 ; JCR ; NCBI Molecular Biology Database ; Nationallizenz ; SCOPUS ; Science Citation Index ; Science Citation Index Expanded ; Web of Science Core Collection

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